A non-invasive beam profile monitor for charged particle beams (2025)

Abstract

Non-interceptive beam profile monitors are highly desirable in almost all particle accelerators. Such techniques are especially valuable in applications where real time monitoring of the beam properties is required while beam preservation and minimal influence on the vacuum are of the greatest importance. This applies to many kinds of accelerators such as high energy machines where the normal diagnostics cannot withstand the beam's power, medical machines where treatment time is valuable and cannot be allocated to diagnostics and also low energy, low intensity accelerators where the beam's properties are difficult to measure. This paper presents the design of a gas-jet based beam profile monitor which was developed and commissioned at the Cockcroft Institute and can operate in a very large background pressure range from 10-7 down to below 10-11 millibars. The functioning principle of the monitor is described and the first experimental results obtained using a 5 keV electron beam are discussed.

Original languageEnglish
Article number204104
JournalApplied Physics Letters
Volume104
Issue number20
DOIs
StatePublished - May 19 2014
Externally publishedYes

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Tzoganis, V., & Welsch, C. P. (2014). A non-invasive beam profile monitor for charged particle beams. Applied Physics Letters, 104(20), Article 204104. https://doi.org/10.1063/1.4879285

Tzoganis, Vasilis ; Welsch, Carsten P. / A non-invasive beam profile monitor for charged particle beams. In: Applied Physics Letters. 2014 ; Vol. 104, No. 20.

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Tzoganis, V & Welsch, CP 2014, 'A non-invasive beam profile monitor for charged particle beams', Applied Physics Letters, vol. 104, no. 20, 204104. https://doi.org/10.1063/1.4879285

A non-invasive beam profile monitor for charged particle beams. / Tzoganis, Vasilis; Welsch, Carsten P.
In: Applied Physics Letters, Vol. 104, No. 20, 204104, 19.05.2014.

Research output: Contribution to journalArticlepeer-review

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N2 - Non-interceptive beam profile monitors are highly desirable in almost all particle accelerators. Such techniques are especially valuable in applications where real time monitoring of the beam properties is required while beam preservation and minimal influence on the vacuum are of the greatest importance. This applies to many kinds of accelerators such as high energy machines where the normal diagnostics cannot withstand the beam's power, medical machines where treatment time is valuable and cannot be allocated to diagnostics and also low energy, low intensity accelerators where the beam's properties are difficult to measure. This paper presents the design of a gas-jet based beam profile monitor which was developed and commissioned at the Cockcroft Institute and can operate in a very large background pressure range from 10-7 down to below 10-11 millibars. The functioning principle of the monitor is described and the first experimental results obtained using a 5 keV electron beam are discussed.

AB - Non-interceptive beam profile monitors are highly desirable in almost all particle accelerators. Such techniques are especially valuable in applications where real time monitoring of the beam properties is required while beam preservation and minimal influence on the vacuum are of the greatest importance. This applies to many kinds of accelerators such as high energy machines where the normal diagnostics cannot withstand the beam's power, medical machines where treatment time is valuable and cannot be allocated to diagnostics and also low energy, low intensity accelerators where the beam's properties are difficult to measure. This paper presents the design of a gas-jet based beam profile monitor which was developed and commissioned at the Cockcroft Institute and can operate in a very large background pressure range from 10-7 down to below 10-11 millibars. The functioning principle of the monitor is described and the first experimental results obtained using a 5 keV electron beam are discussed.

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Tzoganis V, Welsch CP. A non-invasive beam profile monitor for charged particle beams. Applied Physics Letters. 2014 May 19;104(20):204104. doi: 10.1063/1.4879285

A non-invasive beam profile monitor for charged particle beams (2025)
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